ASET Colloquium

Modular Instruments and Automated Testing

by Mr. Mithilesh Pradhan (Field Technical Consultant, National Instruments)

Friday, June 3, 2011 from to (Asia/Kolkata)
at Colaba Campus ( AG-66 )
Description Advances in measurement technology have arisen as a result of increasing demand of stringent timing and synchronization requirements between various Instruments and Measurements devices. In addition to this, there is the ever increasing requirement of handling and streaming very large amounts of Data, often with on-board pre-processing. Given the number of instruments one requires to use, the sheer amount of space that these instruments occupy is a major challenge for large applications.
This talk aims at demonstrating technology that addresses these issues using the power of modular instrumentation and graphical programming and quoting references to common applications in fundamental research.
Organised by Dr. Satyanarayana Bheesette