Description |
Transmission Electron Microscope (TEM) with high-resolution and analytical capabilities is a powerful tool for characterizing fine-scale microstructure of materials and thin films, down to atomic length scale. In this talk, the results of TEM characterization of a variety of materials and thin films obtained by applying various techniques (BF, DF, WBDF, SAD, HRTEM, micro-diffraction, STEM-HAADF, STEM-EDS spectrum imaging, in-situ heating stage TEM) using the TEM will be presented and discussed. The materials would include laser ablation deposited metallic thin films, sputter deposited PZT thin films, MBE grown GaAs based HEMT thin film, MPECVD grown diamond and advanced ceramic composites.
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