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Several techniques based on X-ray scattering are immensely useful for materials characterization. High resolution x-ray diffraction (XRD) is a standard technique for determination of structural information for crystalline materials. While “powder diffraction” is the most popular method, there are several other XRD measurements including pole-figures, asymmetric scans, in-plane diffraction, reciprocal space maps that can provide detailed information about the lattice spacings, strain, structural anisotropy, mosaicity etc. Apart from diffraction, X-ray reflectivity from specular surfaces and measurements of diffuse x-ray scattering are also powerful probes for materials characterization, especially for investigations of thin films and buried layers. I will introduce some basic x-ray characterization techniques, and illustrate it with examples from work in our group at TIFR.
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