Studying interface effects in oxide multilayers with neutron, x-ray and optical techniques

Multilayers from complex oxides can nowadays be grown with very high structural and chemical quality and with atomically sharp interfaces. These oxide multilayers often exhibit greatly improved and sometimes even entirely new physical properties and functionalities that are not inherent to the individual materials from which they are made. The understanding of the underlying principles and interactions that are underlying these interface-related phenomena require the use of suitable experimental techniques that enable one to obtain the relevant depth-resolved information about the physical properties. In my talk I will present examples of using techniques like polarized neutron reflectometry [1-3], resonant x-ray absorption and reflectometry [1, 3], and infrared ellipsometry      [4, 5] to study the depth-resolved magnetic and electronic properties of YBa2Cu3O7/La2/3Ca1/3MnO3 and LaAlO3/SrTiO3 multilayers. 

1.	J. Chakhalian et al., Nature Physics 2, 244, (2006) 
2.	J. Hoppler et al., Nature Materials 8, 315 (2009).
3.	D.K. Satapathy et al., Phys Rev. Lett. 108, 197201 (2012).
4.	A. Dubroka et al., Phys. Rev. Lett. 104, 156807 (2010).
5.	M. Rössle et al., Phys. Rev. Lett. 110, 136805 (2013).