DCMPMS Seminars
Characterization of advanced materials and thin films by Analytical and High-resolution Transmission Electron Microscopy
by Dr. Sandip Bysakh (TEM Laboratory, CSIR-Central Glass and Ceramic Research Institute - Kolkata)
Friday, February 13, 2015
from
to
(Asia/Kolkata)
at AG69
at AG69
Description |
Transmission Electron Microscope (TEM) with high-resolution and analytical capabilities is a powerful tool for characterizing fine-scale microstructure of materials and thin films, down to atomic length scale. In this talk, the results of TEM characterization of a variety of materials and thin films obtained by applying various techniques (BF, DF, WBDF, SAD, HRTEM, micro-diffraction, STEM-HAADF, STEM-EDS spectrum imaging, in-situ heating stage TEM) using the TEM will be presented and discussed. The materials would include laser ablation deposited metallic thin films, sputter deposited PZT thin films, MBE grown GaAs based HEMT thin film, MPECVD grown diamond and advanced ceramic composites. |