X-ray Absorption Fine Structure (XAFS) is unique local structural tool - particularly useful for disordered systems where long-range-order is absent and diffraction/ HRTEM fail to extract details beyond a certain limit. The talk will present characterization and quantification of structural configurations/ defects / oxidation states for wide-ranged nano-systems (bimetallic and semiconductor-metal composite catalysts, semiconductor biosensors, drugs, spintronics, multiferroics, molecular magnetic switches, metallic glass) and their correlation with respective properties of scientific interest. Technical, analytical and sample considerations for the suitability of XAFS for a certain scientific problem and the scope of XAFS at INDUS-2 synchrotron facility (RRCAT) will be addressed.
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