Picometer transmission electron microscopy

"Atomic-resolution studies, both in TEM and STEM mode, are today part of most innovative materials studies word wide. This includes not only structuralstudies but also atomically resolved local elemental analysis by quantitative contrast analysis  and EELS.  Outstanding is the fact that combining ultra-high resolution imaging with modern computer-based quantum-mechanical numerical contrast matching we can today realize a precision of atom-position measurements of about 1 picometer (one hundredth of the diameter of an H-atom). This provides access to the heart of physical properties of crystalline materials. Beyond its classical function as an imaging tool, the electron microscope has become a physical high-precision measurement instrument.

In this talk a brief introduction into modern aberration-corrected transmission electron microscopy will be presented. This will be followed by examples taken from our work on oxides which are suited to illustrate the challenges of performing transmission electron microscopy in atomic, i.e. quantum physical dimensions."